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A 90 nm LUT Array for Speed and Yield Enhancement by Utilizing Within-Die Delay Variations.

Kazuya KatsukiManabu KotaniKazutoshi KobayashiHidetoshi Onodera
Published in: IEICE Trans. Electron. (2007)
Keyphrases
  • real time
  • high speed
  • image processing
  • image enhancement
  • neural network
  • video sequences
  • contrast enhancement
  • critical path
  • view angle