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Electrical Parameters Degradation of E-mode GaN Under Repeated Short-Circuit Impacts.

Lei SunDongqing HuXintian ZhouMeng LiuJie Cao
Published in: EITCE (2020)
Keyphrases
  • short circuit
  • thin film
  • maximum likelihood
  • parameter values
  • neural network
  • parameter settings
  • induction motor
  • real time