Login / Signup

Efficient yield estimation through generalized importance sampling with application to NBL-assisted SRAM bitcells.

Lorenzo CiampoliniJean-Christophe LafontFaress Tissafi DrissiJean-Paul MorinDavid TurgisXavier JonssonCyril DesclèvesJoseph Nguyen
Published in: ICCAD (2016)
Keyphrases
  • importance sampling
  • monte carlo
  • kalman filter
  • machine learning
  • markov chain
  • k means
  • parameter estimation
  • particle filtering
  • rare events