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Challenge-Response Machine-Learning Resistant Strong-PUF in 14nm CMOS Featuring Stability-Aware Adversarial Challenge Selection.

Vikram B. SureshRaghavan KumarMark A. AndersHimanshu KaulVivek DeSanu Mathew
Published in: VLSI Circuits (2020)
Keyphrases
  • machine learning
  • text classification
  • feature selection
  • pattern recognition
  • decision trees
  • data analysis
  • high speed
  • machine learning algorithms
  • data sets
  • learning algorithm
  • inductive learning
  • selection algorithm