CleftNet: Augmented Deep Learning for Synaptic Cleft Detection from Brain Electron Microscopy.
Yi LiuShuiwang JiPublished in: CoRR (2021)
Keyphrases
- deep learning
- electron microscopy
- low energy
- x ray
- unsupervised learning
- unsupervised feature learning
- machine learning
- image stacks
- mental models
- weakly supervised
- object detection
- neural network
- feed forward
- deep architectures
- thin film
- wireless sensor networks
- pattern recognition
- feature extraction
- image segmentation
- data mining