Login / Signup

Identifying Untestable Transition Faults in Latch Based Designs with Multiple Clocks.

Manan SyalMichael S. HsiaoSreejit Chakravarty
Published in: ITC (2004)
Keyphrases
  • databases
  • genetic algorithm
  • artificial neural networks
  • low power
  • real time
  • real world
  • computer vision
  • image processing
  • power consumption
  • error correction
  • model based diagnosis