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In-Situ Observation of Fracture Behavior of Silicon in a Transmission Electron Microscope.
Kohei Okada
Syugo Tanaka
Kensuke Nakata
Masahiro Nakajima
Taeko Ando
Published in:
MHS (2018)
Keyphrases
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electron microscope
x ray
three dimensional
noise level
x ray images
medical imaging
high speed
low cost
ct scans
multiresolution
image denoising
image segmentation
medical images
intraoperative