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Application and Demonstration of a Digital Test Core: Optoelectronic Test Bed and Wafer-level Prober.

J. S. DavisDavid C. KeezerOdile Liboiron-LadouceurKeren Bergman
Published in: ITC (2003)
Keyphrases
  • test bed
  • computer vision systems
  • decision support
  • data sets
  • genetic algorithm
  • case study
  • expert systems