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Thermal transient characterization of semiconductor devices with multiple heat sources - Fundamentals for a new thermal standard.
Dirk Schweitzer
Ferenc Ender
Gusztáv Hantos
Péter G. Szabó
Published in:
Microelectron. J. (2015)
Keyphrases
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thermal conductivity
heat transfer
infrared
semiconductor devices
power plant
thermal images
steady state
multiple sources
databases
finite element analysis
visible spectrum
multi source
solder ball connect
thermal imaging
data sources
search space
reinforcement learning