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Grain Size Reduction of Ferroelectric HZO Enabled by a Novel Solid Phase Epitaxy (SPE) Approach: Working Principle, Experimental Demonstration, and Theoretical Understanding.

Dong ZhangJixuan WuQiwen KongZuopu ZhouLong LiuKaizhen HanChen SunXiaolin WangGan LiuLeming JiaoZijie ZhengYuye KangJiezhi ChenXiao Gong
Published in: VLSI Technology and Circuits (2023)
Keyphrases
  • grain size
  • working principle
  • theoretical analysis
  • experimental data