Device Modeling Bias in ReRAM-Based Neural Network Simulations.
Osama YousufImtiaz HossenMatthew W. DanielsMartin Lueker-BodenAndrew DienstfreyGina C. AdamPublished in: IEEE J. Emerg. Sel. Topics Circuits Syst. (2023)
Keyphrases
- neural network
- artificial neural networks
- back propagation
- neural network is trained
- portable devices
- pattern recognition
- fault diagnosis
- multi layer
- simulation models
- feed forward
- agent based modeling
- variance reduction
- learning vector quantization
- feedforward neural networks
- neural nets
- self organizing maps
- fuzzy logic
- genetic algorithm
- machine learning