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Adjacency criticality: a simple yet effective metric for statistical timing yield optimisation of digital integrated circuits.
Seyed Milad Ebrahimipour
Behnam Ghavami
Mohsen Raji
Published in:
IET Circuits Devices Syst. (2019)
Keyphrases
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integrated circuit
statistical analysis
genetic algorithm
neural network
straight forward
information retrieval
control system
distance measure
data driven
statistical methods
metric space
embedded systems
statistically sound