Defect level prediction for I_DDQ testing.

Yukio Okuda Isao Kubota Masahiro Watanabe

Published in: ITC (1998)

Keyphrases

prediction accuracy
prediction algorithm
prediction error
higher level
test cases
databases
computer vision
three dimensional
levels of abstraction
object oriented
high prediction accuracy
prediction model
real time
hidden markov models
long term
artificial neural networks
data sets