Feature Concentration for Supervised and Semisupervised Learning With Unbalanced Datasets in Visual Inspection.
Jiyong JangSungroh YoonPublished in: IEEE Trans. Ind. Electron. (2021)
Keyphrases
- visual inspection
- semisupervised learning
- supervised learning
- image analysis
- supervised and unsupervised learning
- semi supervised
- laser scanning
- unsupervised learning
- semi supervised learning
- unlabeled data
- machine learning
- fluorescence microscopy images
- computational linguistics
- training set
- image segmentation
- learning algorithm
- data sets
- text classification
- labeled data
- co occurrence
- data points
- cost sensitive
- feature vectors
- object recognition