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A 5nm Wide Voltage Range Ultra High Density SRAM Design for L2/L3 Cache Applications.

Sriharsha EnjapuriDeepesh GujjarSandipan SinhaRamesh HalliManish Trivedi
Published in: VLSI Design (2021)
Keyphrases
  • high density
  • wide range
  • design process
  • cmos technology
  • low density
  • user interface
  • close proximity
  • high power
  • real time
  • low power