Login / Signup

Dynamic stability in minimum operating voltage Vmin for single-port and dual-port SRAMs.

Yasumasa TsukamotoTakeshi KidaT. YamakiYuichiro IshiiKoji NiiKoji TanakaShinji TanakaYuji Kihara
Published in: CICC (2011)
Keyphrases
  • dynamic environments
  • real time
  • evolutionary algorithm
  • power system
  • square error