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Rectangle Placement for VLSI Testing.

Merav AharoniOdellia BoniAri FreundLidor GorenWesam IbraheemTamir Segev
Published in: CPAIOR (2015)
Keyphrases
  • test cases
  • real time
  • test set
  • vlsi circuits
  • knowledge base
  • high speed
  • vlsi design
  • data sets
  • information retrieval
  • bayesian networks
  • optimal solution
  • mobile robot
  • signal processing
  • hough transform
  • axis parallel