Reconstruction Regularized Deep Metric Learning for Multi-Label Image Classification.
Changsheng LiChong LiuLixin DuanPeng GaoKai ZhengPublished in: IEEE Trans. Neural Networks Learn. Syst. (2020)
Keyphrases
- multi label
- metric learning
- image classification
- learning tasks
- multi label classification
- distance metric
- multi task
- image annotation
- visual features
- semi supervised
- dimensionality reduction
- feature extraction
- learning problems
- binary classification
- image features
- distance function
- image representation
- sparse coding
- pairwise
- feature space
- convex relaxation
- svm classifier
- text categorization
- sparse representation
- euclidean distance
- neural network
- graph cuts
- information extraction
- face recognition
- feature selection
- machine learning
- data mining