A Secure JTAG Wrapper for SoC Testing and Debugging.

Kuen-Jong Lee Zheng-Yao Lu Shih-Chun Yeh

Published in: IEEE Access (2022)

Keyphrases

software testing
feature selection
model based diagnosis
lightweight
black box
low power
security issues
security requirements
data sets
information systems
information extraction
low cost
parallel algorithm
security mechanisms
dynamic analysis