Yield Model for Productivity Optimization of VLSI Memory Chips with Redundancy and Partially Good Product.
Charles H. StapperA. N. McLarenM. DreckmannPublished in: IBM J. Res. Dev. (1980)
Keyphrases
- optimization model
- neural network model
- computational model
- prior knowledge
- neural network
- theoretical framework
- formal model
- artificial neural networks
- em algorithm
- theoretical analysis
- statistical model
- optimization process
- probabilistic model
- optimization algorithm
- process model
- mathematical model
- similarity measure
- social networks