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An Effective Model of the Overshooting Effect for Multiple-Input Gates in Nanometer Technologies.
Li Ding
Zhangcai Huang
Atsushi Kurokawa
Jing Wang
Yasuaki Inoue
Published in:
IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (2014)
Keyphrases
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probabilistic model
multiple input
theoretical analysis
mathematical model
formal model
computational model
high quality
experimental data
machine learning
decision making
similarity measure
objective function
cost function
management system
parameter estimation