Measurement of the $D_{it}$ Changes Under BTI-Stress in 4H-SiC FETs Using the Subthreshold Slope Method.
Philipp SteinmannDaniel J. LichtenwalnerShane SteinJae-Hyung ParkSuman DasSei-Hyung RyuPublished in: IRPS (2024)
Keyphrases
- experimental evaluation
- detection method
- objective function
- high precision
- significant improvement
- high accuracy
- neural network
- computational complexity
- evaluation method
- prior knowledge
- model selection
- theoretical analysis
- correlation analysis
- fully automatic
- classification method
- synthetic data
- optimization algorithm
- mutual information
- computational cost
- dynamic programming
- cost function
- pairwise
- computer vision