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Mehr Testwirtschaftlichkeit durch Value-Driven-Testing.

Harry M. SneedStefan Jungmayr
Published in: Inform. Spektrum (2011)
Keyphrases
  • trade off
  • test set
  • database
  • real world
  • learning algorithm
  • clustering algorithm
  • feature extraction
  • natural language
  • computational complexity
  • test generation