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A Reseeding Technique for LFSR-Based BIST Applications.

Nan-Cheng LiSying-Jyan Wang
Published in: Asian Test Symposium (2002)
Keyphrases
  • shift register
  • built in self test
  • random number generator
  • high speed
  • real world
  • genetic algorithm
  • pattern recognition
  • supervised learning
  • information processing
  • stereo matching