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Development of a transmission line model for the thickness prediction of thin films via the infrared interference method.

C. MpilitosNikolaos V. KantartzisStamatios A. AmanatiadisGeorge ApostolidisGeorge KaragiannisTheodoros T. Zygiridis
Published in: MOCAST (2018)
Keyphrases
  • infrared
  • mathematical model
  • edge detection
  • transmission line
  • infrared images
  • dynamic programming
  • multi sensor
  • real time
  • image processing
  • multi layer