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Impact of work-function variation on analog figures-of-merits for high-k/metal-gate junctionless FinFET and gate-all-around nanowire MOSFET.
Wei-feng Lü
Liang Dai
Published in:
Microelectron. J. (2019)
Keyphrases
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field effect transistors
high impact
multiple input
nano scale
wide range
steady state
database
information technology
neural network
case study
reinforcement learning
high precision
piecewise linear