LOCOS induced stress effects on SOI bipolar devices.

Stefania Privitera R. Modica V. Cerantonio Giorgio Fallica G. Pappalardo

Published in: Microelectron. Reliab. (2007)

Keyphrases

positive and negative
mobile devices
learning algorithm
high density
field effect transistors
medical devices
data sets
neural network
search engine
knowledge base
case study
database systems
embedded systems
processing capabilities