Tensor Voting Based Similarity Matching of Wafer Bin Maps in Semiconductor Manufacturing.
Rui WangSonghao WangPublished in: DSIT (2022)
Keyphrases
- semiconductor manufacturing
- similarity matching
- tensor voting
- computational framework
- perceptual grouping
- process control
- surface reconstruction
- edge preserving
- manifold learning
- image retrieval
- retrieval method
- smoothness constraint
- video retrieval
- production system
- range images
- principal component analysis
- image data
- three dimensional