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CMOS compatible GaN-on-Si HEMT technology for RF applications: analysis of substrate losses and non-linearities.

Sachin YadavPieter CardinaelMing ZhaoKomal VondkarUthayasankaran PeralaguAliReza AlianAhmad KhaledSergej MakovejevEnrique EkogaDimitri LedererJean-Pierre RaskinBertrand ParvaisNadine Collaert
Published in: ICICDT (2021)
Keyphrases
  • case study
  • image analysis
  • data analysis
  • high speed
  • statistical analysis
  • wireless sensor networks
  • data processing
  • mathematical analysis