Login / Signup

Analysis of reliability of flip-flops under transistor aging effects in nano-scale CMOS technology.

Vikram G. RaoHamid Mahmoodi
Published in: ICCD (2011)
Keyphrases
  • nano scale
  • flip flops
  • power dissipation
  • image analysis
  • low power
  • neural network
  • high speed
  • real time
  • computer vision