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Accelerating Coverage Directed Test Generation for Functional Verification: A Neural Network-based Framework.
Fanchao Wang
Hanbin Zhu
Pranjay Popli
Yao Xiao
Paul Bogdan
Shahin Nazarian
Published in:
ACM Great Lakes Symposium on VLSI (2018)
Keyphrases
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test generation
case study
database
data sets
image processing
low cost
high speed