A novel approach based on grey simplified best-worst method and grey possibility degree for evaluating materials in semiconductor industries.
Mir Seyed Mohammad Mohsen EmamatSaif WakeelMaghsoud AmiriShafi AhmadSedat BingölPublished in: Soft Comput. (2023)
Keyphrases
- high accuracy
- objective function
- significant improvement
- preprocessing
- high precision
- mathematical model
- detection method
- support vector machine svm
- fully automatic
- synthetic data
- clustering method
- detection algorithm
- similarity measure
- computationally efficient
- mutual information
- experimental evaluation
- cost function
- prior knowledge
- optimization algorithm
- edge detection
- segmentation method
- grey relational analysis
- grey theory