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Reliability of 200mm E-mode GaN-on-Si Power HEMTs.

David C. ZhouWilliam LiJingyu ShenLeilei ChenThomas ZhaoKent LinMartin ZhangLarry ChenH. C. ChiuJeff ZhangRoy K.-Y. Wong
Published in: IRPS (2020)
Keyphrases
  • power consumption
  • structuring elements
  • highly reliable
  • power management
  • power distribution
  • image processing
  • three dimensional
  • power system
  • waveguide
  • metal oxide