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Reliability of 200mm E-mode GaN-on-Si Power HEMTs.
David C. Zhou
William Li
Jingyu Shen
Leilei Chen
Thomas Zhao
Kent Lin
Martin Zhang
Larry Chen
H. C. Chiu
Jeff Zhang
Roy K.-Y. Wong
Published in:
IRPS (2020)
Keyphrases
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power consumption
structuring elements
highly reliable
power management
power distribution
image processing
three dimensional
power system
waveguide
metal oxide