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Classification of Event Related Potentials of Error-Related Observations Using Support Vector Machines.
Pantelis Asvestas
Errikos M. Ventouras
Irene S. Karanasiou
George K. Matsopoulos
Published in:
EANN (2) (2013)
Keyphrases
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classification accuracy
eeg signals
support vector
pattern recognition
decision trees
training set
pattern classification
feature selection
event related potentials
machine learning
support vector machine
feature set
decision rules