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Intelligent maintenance prediction system for LED wafer testing machine.
Chien-Chang Hsu
Min-Sheng Chen
Published in:
J. Intell. Manuf. (2016)
Keyphrases
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prediction accuracy
software maintenance
decision support
test cases
prediction algorithm
machine learning
prediction model
prediction error
intelligent machines
object oriented software
wafer fabrication
databases
neural network
case study
integrated circuit