Login / Signup

A modular test structure for CMOS mismatch characterization.

Massimo ContiPaolo CrippaFrancesco FedecostunteSimone OrcioniF. RicciardiClaudio TurchettiLoris Vendrame
Published in: ISCAS (5) (2003)
Keyphrases
  • database systems
  • database
  • databases
  • website
  • network structure
  • modular structure
  • genetic algorithm
  • structural properties
  • statistical tests