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Practical Analysis of Various Approaches for Targeting Delay Faults at Functional Frequency in Automatic Test Pattern Generation (ATPG).

Bhavesh SoniKishor PurohitDhaval Fichadia
Published in: iSES (2023)
Keyphrases
  • data analysis
  • statistical analysis
  • fault diagnosis
  • quantitative analysis
  • decision making
  • image analysis
  • database
  • databases
  • artificial intelligence
  • artificial neural networks
  • multiresolution