A Robust Area-Efficient Physically Unclonable Function With High Machine Learning Attack Resilience in 28-nm CMOS.
You-Cheng LaiChun-Yen YaoShao-Hong YangYing-Wei WuTsung-Te LiuPublished in: IEEE Trans. Circuits Syst. I Regul. Pap. (2022)
Keyphrases
- machine learning
- pattern recognition
- computationally efficient
- decision trees
- data mining
- active learning
- support vector machine
- neural network
- high efficiency
- high robustness
- cmos technology
- explanation based learning
- highly efficient
- machine learning methods
- machine learning algorithms
- model selection
- natural language processing