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Microwave effects of UV light exposure of a GaN HEMT: Measurements and model extraction.
Alina Caddemi
Emanuele Cardillo
Giuseppe Salvo
Salvatore Patanè
Published in:
Microelectron. Reliab. (2016)
Keyphrases
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probability distribution
computational model
mathematical model
experimental data
prior knowledge
hidden markov models
image sequences
image analysis
cost function
management system
theoretical analysis
gray scale
binary images
statistical model
simulation model