Poster: Effective Layers in Coverage Metrics for Deep Neural Networks.

Leo Hyun Park Sangjin Oh Jaeuk Kim Soochang Chung Taekyoung Kwon

Published in: CCS (2019)

Keyphrases

neural network
multi layer
single layer
pattern recognition
real time
data sets
real world
data mining
artificial intelligence
bayesian networks
artificial neural networks
self organizing maps
cost effective
training process
multiple layers