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Hot electron induced degradation of undoped AlGaN/GaN HFETs.

Hyungtak KimAlexei VertiatchikhRichard M. ThompsonVinayak TilakThomas R. PruntyJames R. ShealyLester F. Eastman
Published in: Microelectron. Reliab. (2003)
Keyphrases
  • structuring elements
  • electron microscopy
  • high energy
  • databases
  • search algorithm
  • color images