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Scalable Device Array for Statistical Characterization of BTI-Related Parameters.
Hiromitsu Awano
Shumpei Morita
Takashi Sato
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2017)
Keyphrases
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parameter space
parameter values
data driven
statistical distribution
data structure
probability distribution
maximum likelihood
statistical analysis
statistical model
statistical models
statistical significance
input parameters
parameter selection
programmable logic
sensor array