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Deep Learning Approach for Apple Edge Detection to Remotely Monitor Apple Growth in Orchards.

Dandan WangChangying LiHuaibo SongHongting XiongChang LiuDongjian He
Published in: IEEE Access (2020)
Keyphrases
  • deep learning
  • edge detection
  • unsupervised learning
  • unsupervised feature learning
  • machine learning
  • multiscale
  • deep architectures
  • image processing
  • mental models
  • weakly supervised