Models for characterizing noise based PCMOS circuits.

Anshul Singh Arindam Basu Keck Voon Ling Vincent John Mooney III

Published in: ACM Trans. Embed. Comput. Syst. (2013)

Keyphrases

probabilistic model
statistical model
data sets
data mining
information retrieval
image processing
model selection
complex systems
process model
noise level
additive noise
analog vlsi