CLEAR: Cache Lines Error Accumulation Reduction by exploiting invisible accesses.

Hamed Farbeh Amir Mahdi Hosseini Monazzah

Published in: Microelectron. J. (2019)

Keyphrases

error accumulation
long image sequences
access patterns
prefetching
memory access
access latency
line drawings
straight line
hit rate
memory hierarchy
response time
line segments
data access
hough transform
shared memory