Comparison of TID response in core, input/output and high voltage transistors for flash memory.
Zhangli LiuZhiyuan HuZhengxuan ZhangHua ShaoMing ChenDawei BiBingxu NingShichang ZouPublished in: Microelectron. Reliab. (2011)
Keyphrases
- input output
- high voltage
- flash memory
- internal states
- solid state
- garbage collection
- file system
- disk drives
- main memory
- embedded systems
- operating conditions
- data envelopment analysis
- storage devices
- random access
- b tree
- database systems
- storage management
- computational intelligence
- software engineering
- artificial neural networks