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Software Defect Prediction for LSI Designs.

Matthieu ParizyKoichiro TakayamaYuji Kanazawa
Published in: ICSME (2014)
Keyphrases
  • software defect prediction
  • software defect
  • ensemble learning
  • feature ranking
  • imbalanced data
  • sample selection bias
  • class imbalance
  • generalization ability
  • neural network
  • machine learning methods
  • ensemble methods