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Circular self-test path: a low-cost BIST technique for VLSI circuits.

Andrzej KrasniewskiSlawomir Pilarski
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1989)
Keyphrases
  • vlsi circuits
  • low cost
  • low power
  • built in self test
  • mixed signal
  • shortest path
  • single chip
  • digital camera
  • wireless sensor networks
  • multi view
  • embedded systems