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Sequential importance sampling for low-probability and high-dimensional SRAM yield analysis.

Kentaro KatayamaShiho HagiwaraHiroshi TsutsuiHiroyuki OchiTakashi Sato
Published in: ICCAD (2010)
Keyphrases
  • high dimensional
  • computer vision
  • probability distribution
  • nearest neighbor
  • graphical models
  • low dimensional
  • similarity search