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Yield Approximation of Analog Integrated Circuits Under Time-Dependent Variability.

Theodor HillebrandMaike TaddikenSteffen PaulDagmar Peters-Drolshagen
Published in: SMACD (2018)
Keyphrases
  • integrated circuit
  • approximation algorithms
  • data sets
  • error bounds
  • approximation methods
  • electron beam
  • neural network
  • analog vlsi
  • three dimensional